High energy X-ray phase and dark-field imaging using a random absorption mask
Crossref DOI link: https://doi.org/10.1038/srep30581
Published Online: 2016-07-28
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Hongchang
Kashyap, Yogesh
Cai, Biao
Sawhney, Kawal
Text and Data Mining valid from 2016-07-28
Version of Record valid from 2016-07-28
Article History
Received: 15 April 2016
Accepted: 4 July 2016
First Online: 28 July 2016
Competing interests
: The authors declare no competing financial interests.