Fermi level pinning characterisation on ammonium fluoride-treated surfaces of silicon by energy-filtered doping contrast in the scanning electron microscope
Crossref DOI link: https://doi.org/10.1038/srep32003
Published Online: 2016-08-31
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chee, Augustus K. W.
Text and Data Mining valid from 2016-08-31
Version of Record valid from 2016-08-31
Article History
Received: 1 March 2016
Accepted: 1 August 2016
First Online: 31 August 2016
Competing interests
: The author declares no competing financial interests.