Electrochemical deposition of layered copper thin films based on the diffusion limited aggregation
Crossref DOI link: https://doi.org/10.1038/srep34779
Published Online: 2016-10-13
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wei, Chenhuinan
Wu, Guoxing
Yang, Sanjun
Liu, Qiming
Text and Data Mining valid from 2016-10-13
Version of Record valid from 2016-10-13
Article History
Received: 25 May 2016
Accepted: 19 September 2016
First Online: 13 October 2016
Competing interests
: The authors declare no competing financial interests.