Effect of the KF post-deposition treatment on grain boundary properties in Cu(In, Ga)Se2 thin films
Crossref DOI link: https://doi.org/10.1038/srep41361
Published Online: 2017-01-27
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nicoara, N.
Lepetit, Th.
Arzel, L.
Harel, S.
Barreau, N.
Sadewasser, S.
Text and Data Mining valid from 2017-01-27
Version of Record valid from 2017-01-27
Article History
Received: 19 July 2016
Accepted: 20 December 2016
First Online: 27 January 2017
Competing interests
: The authors declare no competing financial interests.