Characterization of Thin Film Materials using SCAN meta-GGA, an Accurate Nonempirical Density Functional
Crossref DOI link: https://doi.org/10.1038/srep44766
Published Online: 2017-03-23
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Buda, I. G.
Lane, C.
Barbiellini, B.
Ruzsinszky, A.
Sun, J.
Bansil, A.
Text and Data Mining valid from 2017-03-23
Version of Record valid from 2017-03-23
Article History
Received: 19 October 2016
Accepted: 14 February 2017
First Online: 23 March 2017
Competing interests
: The authors declare no competing financial interests.