MoOx and V2Ox as hole and electron transport layers through functionalized intercalation in normal and inverted organic optoelectronic devices
Crossref DOI link: https://doi.org/10.1038/lsa.2015.46
Published Online: 2015-04-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, Xinchen
Xie, Fengxian
Zhang, Shaoqing
Hou, Jianhui
Choy, Wallace CH
Text and Data Mining valid from 2015-04-10
Version of Record valid from 2015-04-10
Article History
Received: 29 August 2014
Revised: 18 December 2014
Accepted: 13 January 2015
First Online: 10 April 2015