Supercritical angle Raman microscopy: a surface-sensitive nanoscale technique without field enhancement
Crossref DOI link: https://doi.org/10.1038/lsa.2017.66
Published Online: 2017-04-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Serrano, Diana
Seeger, Stefan
Text and Data Mining valid from 2017-04-11
Version of Record valid from 2017-04-11
Article History
Received: 24 October 2016
Revised: 31 March 2017
Accepted: 10 April 2017
First Online: 11 April 2017
Competing interests
: The authors declare no conflict of interest.