Ordered fragmentation of oxide thin films at submicron scale
Crossref DOI link: https://doi.org/10.1038/ncomms13148
Published Online: 2016-10-17
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Guo, L.
Ren, Y. http://orcid.org/0000-0002-0075-3454
Kong, L. Y.
Chim, W. K.
Chiam, S. Y.
Text and Data Mining valid from 2016-10-17
Version of Record valid from 2016-10-17
Article History
Received: 15 December 2015
Accepted: 7 September 2016
First Online: 17 October 2016
Competing interests
: The authors declare no competing financial interests.