Edge dislocation slows down oxide ion diffusion in doped CeO2 by segregation of charged defects
Crossref DOI link: https://doi.org/10.1038/ncomms7294
Published Online: 2015-02-27
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sun, Lixin http://orcid.org/0000-0002-7971-5222
Marrocchelli, Dario
Yildiz, Bilge
Text and Data Mining valid from 2015-02-27
Version of Record valid from 2015-02-27
Article History
Received: 8 September 2014
Accepted: 15 January 2015
First Online: 27 February 2015
Competing interests
: The authors declare no competing financial interests.