Critical assessment of charge mobility extraction in FETs
Crossref DOI link: https://doi.org/10.1038/nmat5035
Published Online: 2017-12-19
Published Print: 2018-01-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Choi, Hyun Ho
Cho, Kilwon
Frisbie, C. Daniel
Sirringhaus, Henning
Podzorov, Vitaly
Text and Data Mining valid from 2017-12-19
Version of Record valid from 2017-12-19
Article History
First Online: 19 December 2017