A simple image correction method for high-throughput microscopy
Crossref DOI link: https://doi.org/10.1038/nmeth.2971
Published Online: 2014-05-29
Published Print: 2014-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Coster, Adam D
Wichaidit, Chonlarat
Rajaram, Satwik
Altschuler, Steven J
Wu, Lani F
Text and Data Mining valid from 2014-05-29
Article History
First Online: 29 May 2014
Competing interests
: The authors declare no competing financial interests.