High-resolution whole-brain staining for electron microscopic circuit reconstruction
Crossref DOI link: https://doi.org/10.1038/nmeth.3361
Published Online: 2015-04-13
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mikula, Shawn
Denk, Winfried
Text and Data Mining valid from 2015-04-13
Article History
Received: 17 December 2014
Accepted: 11 March 2015
First Online: 13 April 2015
Competing interests
: W.D. receives license income for SBEM technology (Gatan, 3View).