Traction microscopy to identify force modulation in subresolution adhesions
Crossref DOI link: https://doi.org/10.1038/nmeth.3430
Published Online: 2015-06-01
Published Print: 2015-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Han, Sangyoon J
Oak, Youbean
Groisman, Alex
Danuser, Gaudenz
Text and Data Mining valid from 2015-06-01
Article History
Received: 12 December 2014
Accepted: 27 March 2015
First Online: 1 June 2015
Competing interests
: The authors declare no competing financial interests.