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Gate-tunable memristive phenomena mediated by grain boundaries in single-layer MoS2

Crossref DOI link: https://doi.org/10.1038/nnano.2015.56

Published Online: 2015-04-06

Published Print: 2015-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Sangwan, Vinod K. http://orcid.org/0000-0002-5623-5285
Jariwala, Deep

Kim, In Soo

Chen, Kan-Sheng

Marks, Tobin J.

Lauhon, Lincoln J.

Hersam, Mark C.
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Text and Data Mining valid from 2015-04-06
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Article History

Received: 19 August 2014

Accepted: 23 February 2015

First Online: 6 April 2015

Competing interests

: The authors declare no competing financial interests.