Deep learning-enhanced microscopy with extended depth-of-field
Crossref DOI link: https://doi.org/10.1038/s41377-023-01323-y
Published Online: 2023-11-24
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhang, Yide http://orcid.org/0000-0002-9463-3970
Text and Data Mining valid from 2023-11-24
Version of Record valid from 2023-11-24
Article History
First Online: 24 November 2023
Conflict of interest
: The author declares no competing interests.