Yeom, Huiran http://orcid.org/0000-0001-8836-2249
Lee, Yonghee http://orcid.org/0000-0001-8095-408X
Ryu, Taehoon
Noh, Jinsung http://orcid.org/0000-0002-7167-8113
Lee, Amos Chungwon http://orcid.org/0000-0002-0350-7080
Lee, Han-Byoel http://orcid.org/0000-0003-0152-575X
Kang, Eunji
Song, Seo Woo
Kwon, Sunghoon
Article History
Received: 26 October 2018
Accepted: 30 January 2019
First Online: 28 February 2019
Competing interests
: S.K., H.Y., Y.L., T.R. and J.N. are authors of a patent application for the method described in this paper (Method for identifying errors occurred by massively parallel sequencing and an apparatus for the same Method for identifying errors occurred by massively parallel sequencing and an apparatus for the same, KR20170119295A, 2016.04.15). The remaining authors declare no competing interests.