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Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements

Crossref DOI link: https://doi.org/10.1038/s41467-020-14832-w

Published Online: 2020-02-24

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Wang, Xing

Hatzoglou, Constantinos

Sneed, Brian

Fan, Zhe

Guo, Wei https://orcid.org/0000-0002-9534-1902
Jin, Ke

Chen, Di

Bei, Hongbin

Wang, Yongqiang https://orcid.org/0000-0002-2938-5640
Weber, William J. https://orcid.org/0000-0002-9017-7365
Zhang, Yanwen https://orcid.org/0000-0003-1833-3885
Gault, Baptiste https://orcid.org/0000-0002-4934-0458
More, Karren L. https://orcid.org/0000-0001-5223-9097
Vurpillot, Francois https://orcid.org/0000-0002-6834-3507
Poplawsky, Jonathan D. https://orcid.org/0000-0002-4272-7043
License Information

Text and Data Mining valid from 2020-02-24

Version of Record valid from 2020-02-24
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Article History

Received: 13 September 2019

Accepted: 5 February 2020

First Online: 24 February 2020

Competing interests

: The authors declare no competing interests.