Funding for this research was provided by:
U.S. Department of Health & Human Services | NIH | National Institute on Aging (R01 AG066764)
Received: 25 May 2022
Accepted: 18 October 2022
First Online: 8 November 2022
: The authors declare the following competing interests. Van Andel Institute has filed a patent application with the US Patent and Technology Office (USPTO #16/977565; PCT # WO2019/167029A1)) entitled “Measuring Replication-Associated DNA Methylation Loss”, which describes methods for measuring genomic DNA methylation loss that is linked to cellular replicative history. The inventors on this patent application are: Benjamin P. Berman, Wanding Zhou, Peter W. Laird, Jamie L. Endicott, and Hui Shen. This patent application is currently pending. A license for this patent application has been issued to Trudiagnostic. P.W.L. and H.S. serve on the Scientific Advisory Board of FOXO Technologies. P.A.N. declares no competing interests.