Author Correction: Passive film characterisation of duplex stainless steel using scanning Kelvin probe force microscopy in combination with electrochemical measurements
Crossref DOI link: https://doi.org/10.1038/s41529-019-0077-2
Published Online: 2019-03-25
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Örnek, Cem http://orcid.org/0000-0002-3029-6493
Leygraf, Christofer
Pan, Jinshan http://orcid.org/0000-0002-4431-0671
Text and Data Mining valid from 2019-03-25
Version of Record valid from 2019-03-25
Article History
First Online: 25 March 2019