Scattering microscopy takes single-particle tracking to the next level
Crossref DOI link: https://doi.org/10.1038/s41592-019-0438-3
Published Online: 2019-05-30
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Strack, Rita
Text and Data Mining valid from 2019-05-30
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Article History
First Online: 30 May 2019
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