Preparing samples from whole cells using focused-ion-beam milling for cryo-electron tomography
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Update policy: https://doi.org/10.1007/SPRINGER_CROSSMARK_POLICY
Wagner, Felix R.
Text and Data Mining valid from 2020-05-13
Version of Record valid from 2020-05-13
30 August 2019
6 March 2020
13 May 2020
F.R.W., R.W., D.S., M.S., J.P. and E.V. have no competing interests. R.S. and H.P. are employees of TFS, and P.F. was an employee.