Fullerene-Containing Electrically Conducting Electron Beam Resist for Ultrahigh Integration of Nanometer Lateral-Scale Organic Electronic Devices
Crossref DOI link: https://doi.org/10.1038/s41598-017-04451-9
Published Online: 2017-06-27
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nakajima, Anri
Tabei, Tetsuo
Yasukawa, Tatsuya
Text and Data Mining valid from 2017-06-27
Version of Record valid from 2017-06-27
Article History
Received: 1 February 2017
Accepted: 2 June 2017
First Online: 27 June 2017
Competing Interests
: The authors declare that they have no competing interests.