Super-resolution Surface Microscopy of Conductors using Magnetic Resonance
Crossref DOI link: https://doi.org/10.1038/s41598-017-05429-3
Published Online: 2017-07-14
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ilott, Andrew J.
Jerschow, Alexej
Text and Data Mining valid from 2017-07-14
Version of Record valid from 2017-07-14
Article History
Received: 15 February 2017
Accepted: 5 June 2017
First Online: 14 July 2017
Competing Interests
: The authors declare that they have no competing interests.