Electron microscopy by specimen design: application to strain measurements
Crossref DOI link: https://doi.org/10.1038/s41598-017-12695-8
Published Online: 2017-09-29
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cherkashin, Nikolay
Denneulin, Thibaud
Hÿtch, Martin J.
Text and Data Mining valid from 2017-09-29
Version of Record valid from 2017-09-29
Article History
Received: 26 June 2017
Accepted: 13 September 2017
First Online: 29 September 2017
Competing Interests
: The authors declare that they have no competing interests.