Intrinsic structural and electronic properties of the Buffer Layer on Silicon Carbide unraveled by Density Functional Theory
Crossref DOI link: https://doi.org/10.1038/s41598-018-31490-7
Published Online: 2018-08-30
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cavallucci, Tommaso
Tozzini, Valentina http://orcid.org/0000-0002-7586-5039
Text and Data Mining valid from 2018-08-30
Version of Record valid from 2018-08-30
Article History
Received: 25 June 2018
Accepted: 15 August 2018
First Online: 30 August 2018
Competing Interests
: The authors declare no competing interests.