Root Mean Square Minimum Distance as a Quality Metric for Stochastic Optical Localization Nanoscopy Images
Crossref DOI link: https://doi.org/10.1038/s41598-018-35053-8
Published Online: 2018-11-21
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sun, Yi http://orcid.org/0000-0002-2527-8311
Text and Data Mining valid from 2018-11-21
Version of Record valid from 2018-11-21
Article History
Received: 24 January 2018
Accepted: 28 October 2018
First Online: 21 November 2018
Competing Interests
: The author declares no competing interests.