Measuring Liquid Drop Properties on Nanoscale 1D Patterned Photoresist Structures
Crossref DOI link: https://doi.org/10.1038/s41598-019-42106-z
Published Online: 2019-04-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Faria-Briceno, Juan J.
Neumann, Alexander
Schunk, P. Randall
Brueck, S. R. J.
Text and Data Mining valid from 2019-04-05
Version of Record valid from 2019-04-05
Article History
Received: 20 November 2018
Accepted: 24 March 2019
First Online: 5 April 2019
Competing Interests
: The authors declare no competing interests.