Resolution enhancement in scanning electron microscopy using deep learning
Crossref DOI link: https://doi.org/10.1038/s41598-019-48444-2
Published Online: 2019-08-19
Update policy: https://doi.org/10.1007/springer_crossmark_policy
de Haan, Kevin
Ballard, Zachary S.
Rivenson, Yair
Wu, Yichen
Ozcan, Aydogan
Text and Data Mining valid from 2019-08-19
Version of Record valid from 2019-08-19
Article History
Received: 7 March 2019
Accepted: 6 August 2019
First Online: 19 August 2019
Competing Interests
: The authors declare no competing interests.