A new method to reliably determine elastic strain of various crystal structures from atomic-resolution images
Crossref DOI link: https://doi.org/10.1038/s41598-019-52634-3
Published Online: 2019-11-14
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chen, J. S.
Liu, Y.
Zhai, Y.
Fan, T. X.
Text and Data Mining valid from 2019-11-14
Version of Record valid from 2019-11-14
Article History
Received: 10 September 2019
Accepted: 14 October 2019
First Online: 14 November 2019
Competing interests
: The authors declare no competing interests.