Imaging low-dimensional nanostructures by very low voltage scanning electron microscopy: ultra-shallow topography and depth-tunable material contrast
Crossref DOI link: https://doi.org/10.1038/s41598-019-52690-9
Published Online: 2019-11-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zarraoa, Laura
González, María U.
Paulo, Álvaro San
Text and Data Mining valid from 2019-11-07
Version of Record valid from 2019-11-07
Article History
Received: 12 April 2019
Accepted: 18 October 2019
First Online: 7 November 2019
Competing interests
: The authors declare no competing interests.