Park, Vivian Y.
Han, Kyunghwa
Seong, Yeong Kyeong
Park, Moon Ho
Kim, Eun-Kyung http://orcid.org/0000-0002-3368-5013
Moon, Hee Jung http://orcid.org/0000-0002-5643-5885
Yoon, Jung Hyun
Kwak, Jin Young
Article History
Received: 7 February 2019
Accepted: 8 November 2019
First Online: 28 November 2019
Competing interests
: Y.K.S. and M.H.P. are employees at Samsung Electronicis Co., Seoul, Korea and participated in the development of the deep learning-based US CAD system. All of the other authors (V.Y.P., K.H., E.K., H.J.M., J.H.Y. and J.Y.K.) disclosed no relevant relationships.