Thickness measurement of transparent liquid films with Paraxial Self-Reference Interferometry
Crossref DOI link: https://doi.org/10.1038/s41598-020-65799-z
Published Online: 2020-06-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Razzaghi, Ahmad
Amjad, Jafar Mostafavi
Maleki, Maniya
Text and Data Mining valid from 2020-06-08
Version of Record valid from 2020-06-08
Article History
Received: 6 January 2020
Accepted: 6 May 2020
First Online: 8 June 2020
Competing interests
: The authors declare no competing interests.