Author Correction: Enhanced super-resolution microscopy by extreme value based emitter recovery
Crossref DOI link: https://doi.org/10.1038/s41598-021-02193-3
Published Online: 2021-11-16
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ma, Hongqiang
Jiang, Wei
Xu, Jianquan
Liu, Yang
Text and Data Mining valid from 2021-11-16
Version of Record valid from 2021-11-16
Article History
First Online: 16 November 2021