Simulation studies on electrical characteristics of silicon nanowire feedback field-effect transistors with interface trap charges
Crossref DOI link: https://doi.org/10.1038/s41598-021-98182-7
Published Online: 2021-09-20
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yang, Yejin
Park, Young-Soo
Son, Jaemin
Cho, Kyoungah
Kim, Sangsig
Text and Data Mining valid from 2021-09-20
Version of Record valid from 2021-09-20
Article History
Received: 18 May 2021
Accepted: 6 September 2021
First Online: 20 September 2021
Competing interests
: The authors declare no competing interests.