Interfacial Coupling and Electronic Structure of Two-Dimensional Silicon Grown on the Ag(111) Surface at High Temperature
Crossref DOI link: https://doi.org/10.1038/srep10310
Published Online: 2015-06-18
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Feng, Jiagui
Wagner, Sean R.
Zhang, Pengpeng
Text and Data Mining valid from 2015-06-18
Version of Record valid from 2015-06-18
Article History
Received: 14 January 2015
Accepted: 8 April 2015
First Online: 18 June 2015
Competing interests
: The authors declare no competing financial interests.