Investigation of diffusion length distribution on polycrystalline silicon wafers via photoluminescence methods
Crossref DOI link: https://doi.org/10.1038/srep14084
Published Online: 2015-09-14
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lou, Shishu
Zhu, Huishi
Hu, Shaoxu
Zhao, Chunhua
Han, Peide
Text and Data Mining valid from 2015-09-14
Version of Record valid from 2015-09-14
Article History
Received: 23 December 2014
Accepted: 17 August 2015
First Online: 14 September 2015
Competing interests
: The authors declare no competing financial interests.