Origins of Highly Stable Al-evaporated Solution-processed ZnO Thin Film Transistors: Insights from Low Frequency and Random Telegraph Signal Noise
Crossref DOI link: https://doi.org/10.1038/srep16123
Published Online: 2015-11-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Joo Hyung
Kang, Tae Sung
Yang, Jung Yup
Hong, Jin Pyo
Text and Data Mining valid from 2015-11-03
Version of Record valid from 2015-11-03
Article History
Received: 14 July 2015
Accepted: 9 October 2015
First Online: 3 November 2015
Competing interests
: The authors declare no competing financial interests.