Determination of critical diameters for intrinsic carrier diffusion-length of GaN nanorods with cryo-scanning near-field optical microscopy
Crossref DOI link: https://doi.org/10.1038/srep21482
Published Online: 2016-02-15
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chen, Y. T.
Karlsson, K. F.
Birch, J.
Holtz, P. O.
Text and Data Mining valid from 2016-02-15
Version of Record valid from 2016-02-15
Article History
Received: 22 October 2015
Accepted: 18 January 2016
First Online: 15 February 2016
Competing interests
: The authors declare no competing financial interests.