In situ synchrotron study of electromigration induced grain rotations in Sn solder joints
Crossref DOI link: https://doi.org/10.1038/srep24418
Published Online: 2016-04-18
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shen, Hao
Zhu, Wenxin
Li, Yao
Tamura, Nobumichi
Chen, Kai
Text and Data Mining valid from 2016-04-18
Version of Record valid from 2016-04-18
Article History
Received: 7 January 2016
Accepted: 29 March 2016
First Online: 18 April 2016
Competing interests
: The authors declare no competing financial interests.