Depth profiles of the interfacial strains of Si0.7Ge0.3/Si using three-beam Bragg-surface diffraction
Crossref DOI link: https://doi.org/10.1038/srep25580
Published Online: 2016-05-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zheng, Yan-Zong
Soo, Yun-Liang
Chang, Shih-Lin
Text and Data Mining valid from 2016-05-09
Version of Record valid from 2016-05-09
Article History
Received: 22 January 2016
Accepted: 18 April 2016
First Online: 9 May 2016
Competing interests
: The authors declare no competing financial interests.