Chemical State Mapping of Degraded B4C Control Rod Investigated with Soft X-ray Emission Spectrometer in Electron Probe Micro-analysis
Crossref DOI link: https://doi.org/10.1038/srep25700
Published Online: 2016-05-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kasada, R.
Ha, Y.
Higuchi, T.
Sakamoto, K.
Text and Data Mining valid from 2016-05-10
Version of Record valid from 2016-05-10
Article History
Received: 4 January 2016
Accepted: 21 April 2016
First Online: 10 May 2016
Competing interests
: The authors declare no competing financial interests.