Migration mechanism of a GaN bicrystalline grain boundary as a model system
Crossref DOI link: https://doi.org/10.1038/srep26493
Published Online: 2016-05-23
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Sung Bo
Yoo, Seung Jo
Kim, Young-Min
Kim, Jin-Gyu
Han, Heung Nam
Text and Data Mining valid from 2016-05-23
Version of Record valid from 2016-05-23
Article History
Received: 10 February 2016
Accepted: 4 May 2016
First Online: 23 May 2016
Competing interests
: The authors declare no competing financial interests.