Defect engineering of the electronic transport through cuprous oxide interlayers
Crossref DOI link: https://doi.org/10.1038/srep27049
Published Online: 2016-06-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fadlallah, Mohamed M.
Eckern, Ulrich
Schwingenschlögl, Udo
Text and Data Mining valid from 2016-06-03
Version of Record valid from 2016-06-03
Article History
Received: 8 January 2016
Accepted: 13 May 2016
First Online: 3 June 2016
Competing interests
: The authors declare no competing financial interests.