Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy
Crossref DOI link: https://doi.org/10.1038/srep27868
Published Online: 2016-06-13
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ren, Xiao-Yan
Kim, Hyun-Jung
Niu, Chun-Yao
Jia, Yu
Cho, Jun-Hyung
Text and Data Mining valid from 2016-06-13
Version of Record valid from 2016-06-13
Article History
Received: 17 March 2016
Accepted: 26 May 2016
First Online: 13 June 2016
Competing interests
: The authors declare no competing financial interests.