In-situ Isotopic Analysis at Nanoscale using Parallel Ion Electron Spectrometry: A Powerful New Paradigm for Correlative Microscopy
Crossref DOI link: https://doi.org/10.1038/srep28705
Published Online: 2016-06-28
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yedra, LluĂs
Eswara, Santhana
Dowsett, David
Wirtz, Tom
Text and Data Mining valid from 2016-06-28
Version of Record valid from 2016-06-28
Article History
Received: 30 March 2016
Accepted: 6 June 2016
First Online: 28 June 2016
Competing interests
: The authors declare no competing financial interests.