Crossmark

A data mining approach for analyzing semiconductor MES and FDC data to enhance overall usage effectiveness (OUE)

Crossref DOI link: https://doi.org/10.1080/18756891.2014.947114

Published Online: 2014

Update policy: https://doi.org/10.1080/tandf_crossmark_01

Authors

Chien, Chen-Fu

Diaz, Alejandra Campero

Lan, Yu-Bin
More Information

Peer Review Statement: The publishing and review policy for this title is described in its Aims & Scope.

Aim & Scope: http://www.tandfonline.com/action/journalInformation?show=aimsScope&journalCode=tcis20