Measurement of thicknesses of thin films by the Fourier spectrometry method
Crossref DOI link: https://doi.org/10.1134/1.1380786
Published Online: 2017-03-07
Published Print: 2001-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gorbunov, G. G.
Perova, T. S.
Seregin, A. G.
Text and Data Mining valid from 2001-06-01
