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Short Single-Fault Tests for Circuits in the Zhegalkin Basis with Arbitrary Stuck-At Faults of Gates

Published Online: 2025-09-08

Published Print: 2025-06

Authors

Popkov, K. A.
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Text and Data Mining valid from 2025-06-01

Version of Record valid from 2025-06-01
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Article History

Received: 2 September 2024

Revised: 22 November 2024

Accepted: 11 December 2024

First Online: 8 September 2025

Conflict of Interest

: The author of this work declares that he has no conflicts of interest.

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