Properties of pairs of test vectors detecting path delay faults in high performance VLSI logical circuits
Crossref DOI link: https://doi.org/10.1134/S0005117915040104
Published Online: 2015-04-07
Published Print: 2015-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Matrosova, A. Yu.
Lipskii, V. B.
Text and Data Mining valid from 2015-04-01