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Electrical Resistance of Copper at High Pressures and Temperatures: Equilibrium Model and Generation of Defects of the Crystal Structure under Shock Compression

Crossref DOI link: https://doi.org/10.1134/S0010508219050149

Published Online: 2019-10-22

Published Print: 2019-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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